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Evaluation on current interruption ability of CO2 and SF6 using current and voltage application highly controlled by power semiconductors

机译:利用功率半导体高度控制的电流和电压应用评估CO2和sF6的电流中断能力

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摘要

This paper reports a new simple test technique to evaluate current interruption ability of arc quenching gases. In the test, current and voltage applied to the arc was controlled using a insulated gate bipolar transistor (IGBT). Switching the IGBT enables us to produce free recovery conditions for a fundamental arc decay in nozzles. In addition to this, a voltage was intentionally applied to the free recovery arcs between the electrodes by switching-off IGBT again at the specified delay time td. This applied voltage is called quasi transient recovery voltage (quasi-TRV). We can evaluate successful interruption or interruption failure by measuring the current between the electrodes after quasi-TRV application. We compared the interruption ability of SF6 and CO2 through this developed technique. The experimental results show that a residual arc in SF6 gas flow decays four times more rapidly than that in CO2 gas flow. Influence of observation holes in the nozzles used in the experiments was also investigated, showing less influence of observation on the arc behavior. © 2015 IEEE.
机译:本文报告了一种新的简单测试技术,用于评估灭弧气体的电流中断能力。在测试中,使用绝缘栅双极晶体管(IGBT)控制施加到电弧的电流和电压。开关IGBT使我们能够为喷嘴的基本电弧衰减产生自由恢复条件。除此之外,通过在指定的延迟时间td再次关断IGBT,有意向电极之间的自由恢复电弧施加电压。施加的电压称为准瞬态恢复电压(准TRV)。我们可以通过在准TRV施加后测量电极之间的电流来评估成功的中断或中断失败。我们通过这种发达的技术比较了SF6和CO2的阻断能力。实验结果表明,SF6气流中的残留电弧衰减速度比CO2气流中的电弧衰减快四倍。还研究了在实验中使用的喷嘴中观察孔的影响,显示观察对电弧行为的影响较小。 ©2015 IEEE。

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